{{product.productLabel}} {{product.model}}
{{#if product.featureValues}}{{product.productPrice.formattedPrice}} {{#if product.productPrice.priceType === "PRICE_RANGE" }} - {{product.productPrice.formattedPriceMax}} {{/if}}
{{#each product.specData:i}}
{{name}}: {{value}}
{{#i!=(product.specData.length-1)}}
{{/end}}
{{/each}}
{{{product.idpText}}}
{{product.productLabel}} {{product.model}}
{{#if product.featureValues}}{{product.productPrice.formattedPrice}} {{#if product.productPrice.priceType === "PRICE_RANGE" }} - {{product.productPrice.formattedPriceMax}} {{/if}}
{{#each product.specData:i}}
{{name}}: {{value}}
{{#i!=(product.specData.length-1)}}
{{/end}}
{{/each}}
{{{product.idpText}}}
Magnification: 20 unit
Length: 304 mm
Width: 210 mm
... the stand to acquire the image. It‘s as easy as that. You can control the microscope and its attached camera without even changing your grip while always focusing on your sample. Clever Ergonomics ...
... materials samples, or biological specimens. Perform non-destructive failure analysis to identify internal defects without cutting your sample or workpiece. Characterize and quantify performance-defining ...
Resolution: 0.2 µm
Weight: 9 kg
Length: 587 mm
The BXFM is our most versatile focus mount which accepts numerous optical and lighting components. The ability to utilize high performance vertical illuminators provides the utmost optical versatility for numerous applications. The focus ...
Resolution: 1 µm
The MX63 and MX63L microscope systems are optimized for high-quality inspections of wafers as large as 300 mm, flat panel displays, circuit boards, and other large samples. Their modular design enables ...
... resolving power but also speed up throughput when inspecting samples with 8’’/200 mm diameter. The illumination is based on the latest LED technology and is fully integrated into the microscope. The ...
Leica Microsystems GmbH
Digital microscope for failure analysis, quality assurance and control, research and development or forensics. The outstanding optics, intuitive handling and intelligent software enables the user to get reliable results. ...
Leica Microsystems GmbH
... allow the inspection of samples with up to 80mm in height. The highly accurate machining of the nosepieces ensures parcentration of all objectives in use. See more with oblique light For an oblique illumination ...
Leica Microsystems GmbH
... diverse applications. Sample Limitations - None Quality and process control often necessitates the analysis of larger pieces or components that cannot be divided into smaller segments. Whether dealing with substantial ...
Inverted Microscopes are compact, durable and used for high magnification needs. They are ideal for the analysis of mounting samples with flat sample surfaces and are equipped to use ...
Magnification: 1 unit - 100 unit
Weight: 26 kg
Length: 295 mm
... Modular, Ergonomic, Inverted Metallurgical Microscope Superb Nikon CFI60-2 optics provide excellent images to both eyepieces and to Nikon’s digital imaging cameras with analysis software. The universal microscope ...
Nikon Metrology
... any need for cumbersome sample displacement. Key Technical Features: 2D Flexure-Guided Scanner with 100 µm x 100 µm Scan Range * High Speed Z Scanner with 15 µm Scan Rang * Low Noise XYZ Position Sensor * Motorized ...
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