Burn-in test sockets

3 companies | 38 products
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burn-in test socket
burn-in test socket
C-Series H-Pin®

C-Series H-Pin® Socket is a modular burn-in socket with clamshell-style lid. The small footprint outline allows for a best-in-class range of package accommodations, from 0.5 mm body size up to 12 mm and optimal socket density per burn-in ...

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Smiths Interconnect
burn-in test socket
burn-in test socket
D Series H-Pin®

D-Series H-Pin® Socket is a performance burn-in socket, with a clamshell-style lid that can be equipped with a heater and thermal sensor. The D-Series line shares the same configurable features as other socket series in the Smiths Interconnect ...

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Smiths Interconnect
burn-in test socket
burn-in test socket
ES Series H-Pin®

ES family Series of sockets extended the scope of a burn-in socket. The modular lid construction can handle up to 1 kW of power and is optimized with thermal simulation to ensure out-of-the-box performance whether liquid or air cooled. ...

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Smiths Interconnect
burn-in test socket
burn-in test socket
ES Micro Series H-Pin®

ES Micro Series Socket is a technological advancement in the burn-in socket segment, with a dual latch clamshell lid to provide co-planar pressure on the DUT when the lid is actuated. The inclusion of the patented H-Pin contact technology ...

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Smiths Interconnect
burn-in test socket
burn-in test socket
ESJ Series H-Pin®

ESJ Series socket is a high-performance burn-in socket, with dual latch clamshell lid to provide co-planar pressure on the DUT when the lid is actuated. The patented H-Pin contact technology in the ESJ Series socket provides versatility ...

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Smiths Interconnect
burn-in test socket
burn-in test socket
K Series H-Pin®

The K-Series socket is designed to apply flat even pressure on the DUT with a secondary lever once the lid has been closed. This is to ensure that the platen does not skid across the top of the device when closing the lid potentially ...

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Smiths Interconnect
burn-in test socket
burn-in test socket
M-Series H-Pin®

M-Series socket has long been the gold standard for reliability and out-of-the-box performance burn-in sockets. The high-quality components have been refined and enhanced over their lifetime for optimum performance and the highest quality. ...

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Smiths Interconnect
burn-in test socket
burn-in test socket
Q-Series H-Pin®

The Q-Series socket is available for mid to large package sizes. The Q-Series is a fully molded socket body and lid designed to meet the rigors of a wide variety of accelerated life testing applications. The lid can be configured with ...

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Smiths Interconnect
burn-in test socket
burn-in test socket
R-Series H-Pin®

The R-Series product line is an open-top reliability socket used for accelerated life testing. With versions of the compression mount open-top design available as a drop-in replacement for other legacy products on the market, there is ...

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Smiths Interconnect
burn-in test socket
burn-in test socket
QN-Series

Smiths Interconnect has taken a leadership role in designing and developing socket solutions for the newest QFN packages such as MLF, BCC, and LPCC. These sockets offer a modular design in a small outline with very low inductance. The ...

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Smiths Interconnect
burn-in test socket
burn-in test socket
GD19-TOLT- series

TO Package Test Socket For TOLT(TO-Leaded top-side cooling) Package Size19.5x32.4mm Here is a socket that can be used for testing thin, high-current, and heat-dissipating surface mount devices with the TOLT package (PG-HDSOP-16). - ...

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JC CHERRY INC.
burn-in test socket
burn-in test socket
GU12-TO252-K-S74X68

TO Package Test Socket For TO-252/D-PAK Size12x24.9mm/0.47x0.98" Clamshell - Burn-in Test - Kelvin Contact(Option) - Cost competitive - Operating Temperature : [Acceptable Device] NTD5862N(ON Semiconductor) RD3U080AAFRA(ROHM) IXTY14N60X2(IXYS) PG-TO252-3-11(Infineon) SUD50N06-09L(Vishay) GK,DK,SK ...

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JC CHERRY INC.
transistor outline (TO) package test socket
transistor outline (TO) package test socket
GU16-TO263-K-S1045X103

TO Package Test Socket For TO-263/D2-PAK Size16x27.9mm/0.63x1.10" Clamshell - Burn-in Test - Kelvin Contact(Option) - Cost competitive - Operating Temperature : [Acceptable Device] IRF5305STRLPBF(Infineon) VS-10TTS08S-M3 ...

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JC CHERRY INC.
transistor outline (TO) package test socket
transistor outline (TO) package test socket
GD18-TO263-

TO Package Test Socket For TO-263/D2-PAK Size18x32.9mm / 0.71x1.30" Clamshell - Burn-in Test - Kelvin Contact(Option) - Current Rating : 10A - Operating Temperature : [Acceptable Device] FDB28N30 (ON Semiconductor) IRFS7437PbF ...

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JC CHERRY INC.
burn-in test socket
burn-in test socket
GD18-TO263-7-x-109

TO Package Test Socket For TO-263-7/D2-PAK Size18x32.9mm / 0.71x1.30" Clamshell - Burn-in Test - Kelvin Contact(Option) - Current Rating : 12A - Operating Temperature : [Acceptable Device] AUIRFSA8409-7P (Infineon) C3M0075120J ...

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JC CHERRY INC.
burn-in test socket
burn-in test socket
GD18-TO252-x-755

TO Package Test Socket For TO-252/D-PAK Size18x32.9mm / 0.71x1.30" Clamshell - Burn-in Test - Kelvin Contact(Option) - Current Rating : 10A - Operating Temperature : [Acceptable Device] IRF40R207 (Infineon) TK560P65Y (TOSHIBA) MJD47 ...

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JC CHERRY INC.
transistor outline (TO) package test socket
transistor outline (TO) package test socket
GD17-TOLL-x-xx

For TOLL(TO-Leadless) Package Test Socket Clamshell Type It can be used for testing space-saving and high-power surface-mounted devices, TOLL (leadless). You can choose from with or without flange. - Kelvin Contact (option) - ...

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JC CHERRY INC.
burn-in test socket
burn-in test socket
GD17-TOLG- series

TO Package Test Socket TOLG(TO-Leaded with Gullwing) Size 16x27.7mm This is a socket compatible with TOLL and features gull-wing leads. It is a surface-mount device with robust implementation strength, suitable for testing TOLG ...

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JC CHERRY INC.
transistor outline (TO) package test socket
transistor outline (TO) package test socket
GD25-HU3PAK-x-S141X142

TO Package Test Socket For HU3PAK Size 25x36.9mm / 0.984x1.453" This socket can be used for testing HU3PAK devices. HU3PAK is a device with excellent heat dissipation and can handle high current. - Kelvin Contact (Option) - ...

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JC CHERRY INC.
Kelvin test socket
Kelvin test socket
GD18-TO263-7-N-109-9AS

Socket for Power Transistors + Evaluation & Burn-In Test Board Set - A set of sockets and boards for various power transistors, suitable for use in evaluation testing or burn-in testing. - Custom design and manufacturing are ...

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JC CHERRY INC.
burn-in test socket
burn-in test socket
YED254

Customised Test Contactor for pitch sizes ≥ 0.30 mm Easy to close cover Higher temperature range available Contact force (typical): 15 g to 25 g Outstanding performance Lab applications Suitable for HAST, HTOL, Burn-In or any ...

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