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EBSD microscopes
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Resolution: 0.7 nm - 1.8 nm
Weight: 5 kg
Width: 340 mm
... as results for elemental analysis (EDS) and diffraction (EBSD). Thermo Scientific ChemiSEM Technology integrates energy dispersive spectroscopy (EDS) capabilities directly into the microscope's user ...
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
Resolution: 0.7, 1, 0.6 nm
... of nanomaterials with sub-nanometer resolution and high material contrast. Verios 5 XHR Scanning Electron Microscope The Verios 5 XHR SEM offers subnanometer resolution over the full 1 keV to 30 ...
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
Resolution: 1.3, 1, 0.8, 3 nm
Environmental scanning electron microscope (ESEM) for the study of materials in their natural state. Quattro Environmental Scanning Electron Microscope The Thermo Scientific Quattro ESEM combines ...
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
Resolution: 0.9, 0.8, 1, 1.2 nm
Weight: 5 kg
Width: 340 mm
... experience. Time on the microscope is precious, and excessive time spent on maintenance, alignments, training, or image optimization needs to be avoided. Apreo 2 Scanning Electron Microscope The new ...
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
Resolution: 515, 1,030 nm
... polishing. In most cases, the laser-milled surfaces are clean enough for direct SEM imaging and even for surface-sensitive techniques such as electron backscatter diffraction (EBSD) mapping. We offer ...
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
Resolution: 1.4, 0.7, 1.2 nm
Weight: 5 kg
Focused ion beam scanning electron microscope for ultra-high resolution, high-quality sample preparation and 3D characterization. The Thermo Scientific Scios 2 DualBeam is an ultra-high-resolution analytical focused ...
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
Magnification: 300,000 unit
Resolution: 3, 4, 7 nm
Weight: 480 kg
... electron microscope. It has excellent image quality, low vacuum mode compatibility, high resolution images in different fields of view. The depth of field is large and the image is rich in stereo. Extended Scalability ...
CIQTEK Co., Ltd.
Magnification: 1 unit - 2,500,000 unit
Resolution: 0.8 nm - 1,200 nm
Weight: 950 kg
CIQTEK SEM5000Pro is a high-resolution, feature-rich field emission scanning electron microscope (FE-SEM, FEG SEM). Advanced column design, high voltage tunneling technology (SuperTunnel), low aberration non-leakage ...
CIQTEK Co., Ltd.
Magnification: 1,000,000 unit
Resolution: 0.9 nm - 2.5 nm
... scanning electron microscope equipped with a high-brightness long-life Schottky field emission electron gun. With the three-stage condenser electron optics column design for beam currents up to 200 nA, SEM4000Pro delivers ...
CIQTEK Co., Ltd.
Magnification: 300,000 unit
Resolution: 4.5, 3.9 nm
SEM2100 is a user-friendly and accessible Tungsten Filament Scanning Electron Microscope (SEM) designed for novice users. It features a simplified operating process, and adheres to industry standards and user habits ...
CIQTEK Co., Ltd.
Magnification: 1 unit - 2,500,000 unit
Resolution: 0.6 nm - 1 nm
Weight: 400 kg
SEM5000X is an ultra-high resolution Field Emission Scanning Electron Microscope(FE-SEM) with breakthrough resolution of 0.6 nm@15 kV and 1.0 nm@1 kV. Benefited from upgraded column engineering process, “SuperTunnel” ...
CIQTEK Co., Ltd.
Resolution: 3, 0.9, 1.6 nm
CIQTEK DB500 is a Field Emission Scanning Electron Microscope with a Focused Ion Beam column for nano analysis and specimen preparation, which is applied with “SuperTunnel” technology, low aberration, and magnetic-free ...
CIQTEK Co., Ltd.
Magnification: 1,000,000 unit
Resolution: 0.9, 1.2, 1.9 nm
The SEM4000X is a stable, versatile, flexible, and efficient field emission scanning electron microscope (FE-SEM). It achieves a resolution of 1.9nm@1.0kV, easily tackles high-resolution imaging challenges for various ...
CIQTEK Co., Ltd.
Magnification: 20 unit - 1,000,000 unit
Resolution: 4, 1.6, 1.2 nm
... high-resolution SEM observations and fast analyses can be conducted utilizing energy dispersive X-ray spectroscopy (EDS) and electron backscatter diffraction (EBSD). Additionally, a three-dimensional ...
Jeol
Magnification: 10 unit - 5,480,000 unit
Resolution: 0.7 nm - 3 nm
... dispersive X-ray spectrometer (EDS), as a common platform. The JSM-IT800 allows for the replacement of the objective lens of the SEM as a module, offering different versions to satisfy various users requirements. With ...
Jeol
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