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Magnification: 2,000,000 unit
Resolution: 2, 10, 3 nm
Tabletop field emission gun scanning electron microscope for high quality imaging across disciplines. Field emission gun scanning electron microscope The Thermo Scientific ...
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
Resolution: 0.3 nm - 1.5 nm
Weight: 500 g
Sample preparation for TEM and STEM imaging or atom probe tomography. Easy to use with advanced automation. Capable of high quality subsurface 3D characterization. FIB sample preparation The new Thermo ...
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
Magnification: 160 unit - 200,000 unit
Resolution: 0 nm - 10,000 nm
Desktop SEM enabling high quality steel manufacturing through failure analysis and process improvement. Metallurgists and researchers in steel manufacturing need scanning electron microscopy (SEM) ...
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
Magnification: 3,000,000 unit
Resolution: 0.8, 0.4, 1.2 nm
... SU9000 utilizes an ultra-stable side-entry sample stage similar to high-end TEM systems and incorporates optimized vibration damping and a closed cabinet to shield the electron optics from environmental noise.
Hitachi High-Tech Europe GmbH
Magnification: 20 unit - 2,000,000 unit
Resolution: 0.9, 0.8 nm
The SU8700 brings in a new era of ultrahigh-resolution Schottky field emission scanning electron microscopes to the long-standing Hitachi EM lineup. This revolutionary FE-SEM platform incorporates multifaceted ...
Hitachi High-Tech Europe GmbH
Magnification: 20 unit - 2,000,000 unit
Resolution: 0.7, 0.6 nm
The SU8600 brings in a new era of ultrahigh-resolution cold-field emission scanning electron microscopes to the long-standing Hitachi EM lineup. This revolutionary CFE-SEM platform incorporates multifaceted ...
Hitachi High-Tech Europe GmbH
DIGITAL MICROSCOPE FOR AUTOMATIC BRINELL MEASUREMENTS ISO 6506 - ASTM E10 Electronic microscope for automatic Brinell indentation measurement with a ball of Ø 2.5 or 5 or 10 mm •User friendly and compact •Auto ...
Magnification: 300,000 unit
Resolution: 3, 4, 8 nm
Weight: 480 kg
CIQTEK SEM3200 is a high-performance tungsten filament scanning electron microscope. It has excellent image quality, low vacuum mode compatibility, high resolution images in different fields of view. ...
CIQTEK Co., Ltd.
Magnification: 1 unit - 2,500,000 unit
Resolution: 0.8, 1.2 nm
Weight: 950 kg
CIQTEK SEM5000Pro is a high-resolution, feature-rich field emission scanning electron microscope (FE-SEM, FEG SEM). Advanced column design, high voltage tunneling technology (SuperTunnel), low aberration ...
CIQTEK Co., Ltd.
Magnification: 1,000,000 unit
Resolution: 2.5, 0.9 nm
CIQTEK SEM4000Pro is an analytical field emission scanning electron microscope equipped with a high-brightness long-life Schottky field emission electron gun. With the three-stage ...
CIQTEK Co., Ltd.
... to operate and get high-contrast and high-resolution images." CRYO ARM™ 300 II is a cryo-electron microscope that specializes in the observation of electron beam-sensitive specimens, ...
Jeol
Magnification: 50 unit
Weight: 45 kg
... range of semiconductor microscopes ideal for inspection of integrated circuits (IC), flat panel displays (FPD), large scale integration (LSI) electronic devices and many more applications. Advanced Semiconductor Microscopes ...
Resolution: 20 nm
... Scanning Electron Microscope (SEM), PEEM directly images surface areas emitting photoelectrons in real-time, without scanning. Electron emission from surfaces can be caused in various ...
Video Toolmaker Microscope(Standard) Usage Video toolmaker microscope is a photoelectric measuring system of high precision and efficiency. This video toolmaker Microscope is widely ...
To identify the smallest and most subtle defects in leading-edge packaged microelectronic applications, ECHO VS includes standard features such as heated water for optimum acoustic coupling, Flexible TAMI for efficient capture of the ...
Magnification: 1,000,000 unit
Resolution: 3 nm
... Scanning Electron Microscope(SEM). It excels in versatility and flexibility by combining high performance in all SEM modes & Particle counter with ease of operation in a multi-user material ...
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