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The Auto SE is a spectroscopic ellipsometer, manufactured by HORIBA Scientific. It enables automatic analysis of thin film samples with simple push button operation. In a few seconds, a complete analysis report is generated, ...
HORIBA Scientific
NEW UVISEL PLUS: THE REFERENCE ELLIPSOMETER FOR THIN FILM MEASUREMENTS The new UVISEL PLUS spectroscopic ellipsometer includes the newest acquisition technology designed to measure thin film samples ...
HORIBA Scientific
The UVISEL 2 VUV is a ne generation of phase modulation ellipsometer for VUV measurement. It is the main spectroscopic ellipsometer available, intended to convey the quickest thin film measurements over ...
HORIBA Scientific
... array of ellipsometer like in-situ and in-line are used in controlling processes in research and in industry. From thin film monitoring to large area mapping and in-line characterization of flexible devices. In-situ spectroscopic ...
HORIBA Scientific
... software has several hundred material models. The PHE-102 ellipsometer includes all the hardware and software needed for acquiring and analyzing all sample data. In addition, PHE-103 ellipsometer software ...
... configurations. The M-2000 is the first ellipsometer to truly excel at everything from in-situ monitoring and process control to large-area uniformity mapping and general purpose thin film characterization. No other ellipsometer ...
J.A. Woollam Co.
... applications of spectroscopic ellipsometry. Advanced Measurement Capabilities The RC2 is the first commercial spectroscopic ellipsometer to collect all 16 elements of the Mueller matrix. Mueller matrix SE allows characterization ...
J.A. Woollam Co.
The iSE is a new in-situ spectroscopic ellipsometer developed for real-time monitoring of thin film processing. Using our proven technology, the iSE enables users to optimize optical properties of deposited films, control ...
J.A. Woollam Co.
The theta-SE is a push-button spectroscopic ellipsometer for characterizing thin film uniformity. It features advanced ellipsometry instrumentation in a compact package at an affordable price. Fully Integrated The ...
J.A. Woollam Co.
For routine measurements of thin film thickness and refractive index, this ellipsometer allows you to mount a sample, choose the model that matches your film, and press “measure”. You have results within seconds. Easy-to-Use Push-button ...
J.A. Woollam Co.
The VASE® is an accurate and versatile ellipsometer for research on all types of materials: semiconductors, dielectrics, polymers, metals, multi-layers, and more. It combines high accuracy and precision with a wide spectral ...
J.A. Woollam Co.
The IR-VASE® is the first and only spectroscopic ellipsometer to combine the chemical sensitivity of FTIR spectroscopy with thin film sensitivity of spectroscopic ellipsometry. The IR-VASE covers the wide spectral range ...
J.A. Woollam Co.
The VUV-VASE® variable angle spectroscopic ellipsometer is the gold standard for optical characterization of lithography thin films. It measures wavelengths from vacuum ultraviolet (VUV) to near infrared (NIR). This provides ...
J.A. Woollam Co.
UNECS series is a kind of spectroscopic ellipsometers to measure the refractive index and thickness of the thin film quickly and accurately. It adopts an unique measurement method, and realizes the compact size and high-speed ...
An ellipsometer is a surface analytical device which measures changes in light polarization both before and after a beam is reflected from the surface to be analyzed.
ApplicationsEllipsometers are used in the optical, metallurgical and microelectronics industries to measure the thickness of surface coatings, to analyze protective coatings, to measure surface roughness, etc.
TechnologiesThe principal types of ellipsometer are spectroscopic models, which use a broad-band light source, and laser models using a monochromatic light source.
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