- Metrology - Laboratory >
- Analytical Instrumentation >
- GISAXS diffractometer
GISAXS diffractometers
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... souce and the HB-TXS High-Brillliance Turbo X-ray Souce HB-TXS. The D8 DISCOVER is the flagship multi-purpose X-ray diffractometer offering leading technology components. It is designed for the structural characterization ...
... reflectometry, reciprocal space mapping, gracing incidence diffraction (in-plane GID), gracing incidence small angle X-ray scattering (GISAXS), stress and texture analysis, and micro-diffraction, depending on accessories. DIFFRAC.DAVINCI ...
Accelerate your research The Nano-inXider gives you answers on the nanostructure of your sample, whether in solid, liquid, gel, powder or thin film. It uses small- and wide-angle x-ray scattering Examples of applications are: • Particle ...
Xenocs
The Next Generation beamline for the laboratory Maximum flexibility Ultimate performance Plenty of space for sample environment The Xeuss 3.0 is the latest generation instrument in the proven Xeuss family and is already installed ...
Xenocs
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