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- Interferometric profilometer
Interferometric profilometers
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Compact Optical Profiler for Microstructures and Roughness TopMap Micro.View® is the compact measuring system of the TopMap family of whitelight interferometers enabling repeatable and high-resolution inspections and ...
COMBINED OPTICAL 3D MEASUREMENT OF SURFACE DETAILS, FORM PARAMETERS & ROUGHNESS The TopMap Pro.Surf+ offers customized solutions for all surface characterization requirements, evaluating form parameters such as flatness, step heights, ...
... the Nexview™ NX2 3D optical profiler combines exceptional precision, advanced algorithms, application flexibility, and automation into a single package that represents ZYGO's most advanced Coherence Scanning Interferometric ...
Zygo
Production Ready 3D Optical Profiler System ZeGage Pro HR 3D Optical Profiler The ZeGage™ Pro and ZeGage™ Pro HR 3D optical profilers provide non-contact measurement and characterization ...
Zygo
... of ZYGO's NewView products. The NewView 9000 profiler offers exceptional value with applications as varied as flatness, roughness and waviness, thin films, step heights and more. All NewView 9000 profilers ...
Zygo
... features with sub-nanometer vertical precision and sub-micron lateral precision. Powerful Performance Coherence Scanning Interferometry (CSI) is the measurement technology at the core of the Nexview™ 650 system. This ...
Zygo
The S lynx 2 is a compact and versatile 3D optical system for roughness, volume, and critical dimensions measurements. Fast acquisition The S lynx 2 is equipped with three very powerful measuring techniques: Interferometry, Confocal, ...
New integrable areal confocal head The S mart 2 is the only autonomous areal confocal profilometer in the market. Its powerful features and the compact design turns it into a breakthrough in the optical field. Never ...
The Panasonic UA3P profilometer series is designed to measure aspherical lenses & molds, semiconductor wafers, and any other precision component requiring nanometer level accuracy ranging up to 200mm x 200mm. Different ...
... and silicon wafers is critical for successful integration of 3DIC assemblies. Traditional contact probes or conventional interferometry systems are too slow or do not have the necessary accuracy for larger fields of view.
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