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Compact Optical Profiler for Microstructures and Roughness TopMap Micro.View® is the compact measuring system of the TopMap family of whitelight interferometers enabling repeatable and high-resolution inspections and ...
Designed for the most demanding applications, the Nexview™ NX2 3D optical profiler combines exceptional precision, advanced algorithms, application flexibility, and automation into a single package that represents ZYGO's ...
The SJ5720-OPT series is a capable to measure both surface roughness and profile after once scanning. Moreover, there is a dedicated software module for measurement and analysis of large aspheric surface, so this series is an ideal measurement ...
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