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Resolution: 0.7, 1, 0.6 nm
... of nanomaterials with sub-nanometer resolution and high material contrast. Verios 5 XHR Scanning Electron Microscope The Verios 5 XHR SEM offers subnanometer resolution over the full 1 keV to 30 ...
Weight: 990 kg
Width: 1,190 mm
Height: 1,800 mm
... system designed to meet the analytical needs of the 10-nm design node semiconductor device and beyond. The precision piezoelectric-driven actuator is equipped with X, Y and Z axes probe movements allowing the probes ...
The Hitachi NE4000 nanoEBAC is an electron beam based probing system for electrical characterization and EBAC analysis and imaging of microelectronic device interconnects, materials, and components. Electron Beam Absorbed Current (EBAC) ...
... fitted on microscopes, and are compatible with a wide range of microscopes and other optical systems. This cost efficient solution for slim adjustment on the microscope. It is extremely ...
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