{{product.productLabel}} {{product.model}}
{{#if product.featureValues}}{{product.productPrice.formattedPrice}} {{#if product.productPrice.priceType === "PRICE_RANGE" }} - {{product.productPrice.formattedPriceMax}} {{/if}}
{{#each product.specData:i}}
{{name}}: {{value}}
{{#i!=(product.specData.length-1)}}
{{/end}}
{{/each}}
{{{product.idpText}}}
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{{#if product.featureValues}}{{product.productPrice.formattedPrice}} {{#if product.productPrice.priceType === "PRICE_RANGE" }} - {{product.productPrice.formattedPriceMax}} {{/if}}
{{#each product.specData:i}}
{{name}}: {{value}}
{{#i!=(product.specData.length-1)}}
{{/end}}
{{/each}}
{{{product.idpText}}}
... resolution down to 255 nm in xy, enabling subcellular resolution in living samples free of phototoxic effects. A Nikon CFI Plan Fluor 10x W 0.3 NA water immersion objective lens projects the light-sheet on the sample. ...
Magnification: 300,000 unit
Resolution: 3, 4, 7 nm
Weight: 480 kg
... electron microscope. It has excellent image quality, low vacuum mode compatibility, high resolution images in different fields of view. The depth of field is large and the image is rich in stereo. Extended Scalability ...
Magnification: 300,000 unit
Resolution: 4.5, 3.9 nm
SEM2100 is a user-friendly and accessible Tungsten Filament Scanning Electron Microscope (SEM) designed for novice users. It features a simplified operating process, and adheres to industry standards and user habits ...
Magnification: 50 unit - 500 unit
... photographic methods. It is a new technology in the field of microscope to input microscopic imaging into microcomputer and to process images by microprocessor. Image metallographic microscope, connected ...
... -1125 – M-1126- M-1127- M-1128- M-1129- M-1130 – IOS W-PLAN objectives M-1060 – M-1061 – M-1062 – M-1063 – M-1064 – IOS W-PLAN F objectives M-1120.N – M-1121.N – M-1122.N – M-1123.N – IOS W-PLAN ...
Magnification: 100, 400 unit
1. Application HL-BJ-X Portable Metallurgical Microscopes has vertical illumination light source. Applicable to metallographic inspection of various work pieces which is large or unable to make sample. No need to cut ...
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