Probe stations

... of the Model TTPX Tabletop Probe Station Entry-level system Compact table-top design Affordable Rapid cooldown and warmup Backside optical access The Model TTPX probe station ...

The magnetic field probe station is mainly used for testing the electrical and magnetic characteristics of semiconductor materials, micro-nano devices, magnetic materials, spintronic devices and related ...

... combination of the probe station and the high-precision bipolar constant current power supply independently developed by our company enables users to achieve high stability of the magnetic field. The ...

▹ One-dimensional magnetic field probe station, providing in-plane magnetic field, the uniformity of magnetic field is ±1%@φ2 mm; ▹ Real-time monitoring and feedback of magnetic field strength, the monitoring ...

Two-dimensional magnetic field probe station, including two sets of magnets, can provide vertical and in-plane magnetic fields at the same time, and the magnetic field uniformity is ±1%@∅1mm; Real-time ...

... The probe station is equipped with a movable sample stage, which can realize two-dimensional movement in the horizontal direction and 360-degree rotation of the sample stage, which is convenient for ...

In-plane magnetic field probe station, with universal design except for magnet, magnetic field uniformity ±1%@φ1 mm; Real-time monitoring and feedback of magnetic field strength, the monitoring accuracy ...

One-dimensional magnetic field probe station, providing vertical magnetic field, the uniformity of magnetic field is ±1%@d2mm; Real-time monitoring and feedback of magnetic field strength, the monitoring ...

Vertical magnetic field probe station, except for the magnet, the structure is universally designed, and the magnetic field uniformity is ±1%@φ1 mm; Real-time monitoring and feedback of magnetic field ...

... premier manual probe stations designed to be flexible and easy to use. The high level of performance and affordability of these manual probe systems put them in a class of their own. With ...

Standard Semi-Automated Systems • Motorized XY chuck, motorized platen in SPS-2600, motorized Z movement of the chuck in SPS 2800 in standard configuration. Motorized theta is an option. • Stepper motor-based, no encoders. ...

High-Precision Semi-Automated Systems   • Motorized XY chuck, motorized Z movement of the chuck in standard configuration. Motorized theta is an option. • Stepper motor-based, linear encoders. • Cost competitive for ...

High-Speed Semi-Automated Systems • Motorized XY chuck, motorized platen in SPS-2600, motorized Z movement of the chuck in SPS 2800 in standard configuration. Motorized theta is an option. • Servo motor-based, linear encoders. ...

The LCS-4000 Probe Station with Integrated Laser Cutting System gives the user maximum flexibility in semiconductor diagnostic cutting, failure analysis, trimming, marking and topside layer removal. All ...

... sample resistivity distribution. MicroXact’s four-point probes measure the average resistance of semiconductor wafers of layers by passing current through the outside points of a four-point probe and ...

... load lock capabilities. The systems can be configured with individual probe arms (optionally with wedge probes) or with probe card holders. High density probing with >100 of DC probes ...

The Models CPS-HT are MicroXact’s high temperature probe systems for testing and characterization of devices at highest temperatures on the market either in vacuum or in controlled gas environment. We offer manual wafer ...

... . Features • MPS series magnetic probe stations are the only probe stations on the market that offer arbitrary two- or three-dimensional orientation of applied ...

... testing of devices and components that are prone to oxidation, MicroXact’s vacuum probe systems offer controlled environment wafer-level probing. Vacuum Probe Station Features ...

The HPD IQ3000 is a high precision fully automated probe station for 150 mm and 200 mm substrates in a 4 K environment. To accelerate the realization of commercial quantum and superconducting computers, ...

... a true 4K system with a temperature stability 5mK. Mechanical vibration is also a major issue for probing applications. Probe to device under test (DUT) displacement can cause damage to the sample and induce noise ...

... support tube that couples the vibrations from the cooler directly into the floor away from your experiment. The result is probe to DUT displacement of less than 50nm RMS.

Large Ultra Low Vibration Chip-scale Probe Station for Conducting High-Accuracy Measurements at True 4K Cryogenic Temperatures The HPD Kilimanjaro 1260 is a superior 4K solution to meet all your probing ...