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Resolution: 1 µm
The MX63 and MX63L microscope systems are optimized for high-quality inspections of wafers as large as 300 mm, flat panel displays, circuit boards, and other large samples. Their modular design enables you to choose the ...
Magnification: 3,000,000 unit
Resolution: 0.8, 0.4, 1.2 nm
The Cold Field Emission source is ideal for high-resolution imaging with a small source size and energy spread. Innovative CFE Gun technology contributes the ultimate FE-SEM with superior beam brightness and stability, affording high-resolution ...
Magnification: 5 unit - 800,000 unit
Resolution: 15, 4, 3 nm
Performance & Power in a Flexible Platform Hitachi High-Tech's scanning electron microscopes SU3800/SU3900 deliver both operability and expandability. The operator can automate many operations and efficiently utilize ...
Magnification: 20 unit - 8,000,000 unit
Resolution: 0.08, 0.1 nm
... electron gun (Cold FEG) • Ultra-stable column and power supplies for enhanced instrument performance • Simultaneous Cs-corrected SEM & STEM imaging capability with atomic resolution • New high-stability side-entry ...
Magnification: 66 unit - 1,000,000 unit
Resolution: 1.3 nm
Length: 1,716 mm
High-speed scanning electron microscope for cross-scale imaging of large-volume specimens CIQTEK HEM6000 facilities technologies such as the high-brightness large-beam current electron gun, high-speed electron beam ...
The new "Machine Vision Microscope" (MVM) is a purely digital microscope with all the features that make a microscope. It has an apochromatically highly corrected microscope ...
... analyzes. Entry-level inverted microscope for general purpose applications for hardness testing. Industrial and materials science inverted microscope especially designed for opaque specimens (including ...
Weight: 17 kg
Length: 490 mm
Width: 251 mm
The ECLIPSE LV100N POL and Ci-POL series of polarising microscopes is used to study the birefringent properties of anisotropic specimens by observing image contrast and colour changes. Nikon offers systems for both quantitative ...
Nikon Metrology
Magnification: 10 unit - 5,480,000 unit
Resolution: 0.7 nm - 3 nm
... dispersive X-ray spectrometer (EDS), as a common platform. The JSM-IT800 allows for the replacement of the objective lens of the SEM as a module, offering different versions to satisfy various users requirements. With ...
ZTX-S series zoom microscope adopts optical imaging system,with high resolution,fine definition and strong sense of three-dimensional,easy operation.The microscope is Widely used in semiconductor ...
... new rf and transducer technologies of up to 400 MHz, controlled through a user friendly graphical interface. Built to semiconductor industry standards around a core platform that utilizes the latest production and research ...
PVA TePla Analytical Systems GmbH
... rotating turret and high quality objective lenses with long working distance. • Ideal as the microscope unit of a prober station for semiconductors. • The L- and L4-models support YAG laser ...
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