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Compact Optical Profiler for Microstructures and Roughness TopMap Micro.View® is the compact measuring system of the TopMap family of whitelight interferometers enabling repeatable and high-resolution inspections and ...
TopMap Micro.View®+ é o perfilador de superfície óptica da próxima geração. Projetado para modularidade, esta estação de trabalho abrangente permite inspeções de rotina rápidas e eficientes, bem como configurações personalizadas e específicas ...
SuperView W1 Optical 3D Surface profilometer is an ideal instrument for sub-Nanometer measurement of various precision parts. Based on the principle of white light interference technology, combined with precision Z-direction ...
Chotest Technology Inc.
SuperView W3 Optical 3D Surface profilometer is an ideal instrument for sub-Nanometer measurement of various precision parts. Based on the principle of white light interference technology, combined with precision Z-direction ...
Chotest Technology Inc.
SuperView W1 Optical 3D Surface profilometer is an ideal instrument for sub-Nanometer measurement of various precision parts. Based on the principle of white light interference technology, combined with precision Z-direction ...
Chotest Technology Inc.
The SJ5720-OPT series is a capable to measure both surface roughness and profile after once scanning. Moreover, there is a dedicated software module for measurement and analysis of large aspheric surface, so this series is an ideal measurement ...
Chotest Technology Inc.
The S lynx 2 is a compact and versatile 3D optical system for roughness, volume, and critical dimensions measurements. Fast acquisition The S lynx 2 is equipped with three very powerful measuring techniques: Interferometry, Confocal, ...
... profiler. The HRP offers production proven performance with automated wafer handling capability serving the semiconductor, compound semiconductor, high brightness LED, data storage and related industries. ...
KLA Corporation
The Zeta™-388 non-contact profiler provides 3D metrology and imaging capability, combined with an integrated isolation table and a cassette-to-cassette wafer handling system for fully automated measurements. The system ...
KLA Corporation
The Zeta-20 benchtop optical profiler is a non-contact, 3D surface topography measurement system. The system is powered by patented ZDot™ technology and Multi-Mode optics, enabling measurement of a variety of samples: ...
KLA Corporation
... scan. This delivers in-line height measurements for inspection, detection, identification, and guidance in electronics, semiconductor, automotive and factory automation markets segments. Delivering scan speeds of up ...
Dalsa
High-Performance 3D Profiler Sensor for In-Line Measurement and Inspection Applications Z-Trak is a series of 3D profile sensors delivering high-resolution, real-time height measurements using laser triangulation. These ...
Dalsa
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