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{{#each product.specData:i}}
{{name}}: {{value}}
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{{/end}}
{{/each}}
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{{#if product.featureValues}}{{product.productPrice.formattedPrice}} {{#if product.productPrice.priceType === "PRICE_RANGE" }} - {{product.productPrice.formattedPriceMax}} {{/if}}
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{{#i!=(product.specData.length-1)}}
{{/end}}
{{/each}}
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Measuring range: 2 mm
Measurement accuracy: 4 µm
Measurement width: 200 mm - 400 mm
... confocal chromatic displacement sensors for the thickness measurement. The sensors allow for measurements to be performed with outstanding accuracy and high measuring rates. In addition, this innovative ...
Measuring range: 10 nm - 50,000 nm
Ambient temperature: 18 °C - 45 °C
The compact film thickness monitor is a reflection spectrophotometric film thickness meter that uses a small reflection probe and is applicable in all situations from the laboratory level to in-line 100% ...
Shashin Kagaku
Measuring range: 300 mm
... the compact film thickness monitor. It can be installed at the load port of semiconductor manufacturing equipment to control the film thickness on the manufacturing equipment while maintaining cleanliness. 1 ...
Shashin Kagaku
Measuring range: 11, 34, 13 mm
Imaging film thickness monitor is a metrology tool that can visualize the film thickness distribution of a transparent multilayer film. It can visualize the film thickness distribution ...
Shashin Kagaku
Measuring range: 950 nm - 1,650 nm
Infrared sheet thickness monitors measure the thickness of translucent sheets such as battery separators, low reflective coatings such as black resist, and silicon. It can be used in all applications ...
Shashin Kagaku
... substrates. • High-Performance Measurements – with a 7.5 millisecond measurement speed (up to 10 times faster than other IR gauges), the SR710S provides high-speed gauging performance with accuracy to achieve robust, ...
Measure deposition rates, film thickness, optical constants (n and k), and uniformity of semiconductors and dielectric layers in real-time with the F30 spectral reflectance system. Example ...
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