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Film Metrology Systems The SpectraFilm™ F1 film metrology system helps achieve strict process tolerances at sub-7nm logic and leading-edge memory design nodes by providing high-precision thin film ...
KLA Corporation
Film Metrology Systems The Aleris® film metrology systems provide reliable and precise measurement of film thickness, refractive index, stress and composition for the 32nm node and beyond. Utilizing ...
KLA Corporation
... and production monitoring systems are indispensable. The COLOR CONTROL technology combines the proven online COLOR CONTROL color measurement technology with a technical production monitoring ...
PRESSURE MEASUREMENT MACHINE / CARBONATED PRODUCTS Innovative in-line application of Laser Spectroscopy technology. The analysis of a laser beam passing through the headspace of a container is able to provide the information related ...
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