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Film Metrology Systems The SpectraFilm™ F1 film metrology system helps achieve strict process tolerances at sub-7nm logic and leading-edge memory design nodes by providing high-precision thin film ...
KLA Corporation
Film Metrology Systems The Aleris® film metrology systems provide reliable and precise measurement of film thickness, refractive index, stress and composition for the 32nm node and beyond. Utilizing ...
KLA Corporation
PRESSURE MEASUREMENT MACHINE / CARBONATED PRODUCTS Innovative in-line application of Laser Spectroscopy technology. The analysis of a laser beam passing through the headspace of a container is able to provide the information related ...
... and production monitoring systems are indispensable. The COLOR CONTROL technology combines the proven online COLOR CONTROL color measurement technology with a technical production monitoring ...
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