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{{#if product.featureValues}}{{product.productPrice.formattedPrice}} {{#if product.productPrice.priceType === "PRICE_RANGE" }} - {{product.productPrice.formattedPriceMax}} {{/if}}
{{#each product.specData:i}}
{{name}}: {{value}}
{{#i!=(product.specData.length-1)}}
{{/end}}
{{/each}}
{{{product.idpText}}}
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{{#if product.featureValues}}{{product.productPrice.formattedPrice}} {{#if product.productPrice.priceType === "PRICE_RANGE" }} - {{product.productPrice.formattedPriceMax}} {{/if}}
{{#each product.specData:i}}
{{name}}: {{value}}
{{#i!=(product.specData.length-1)}}
{{/end}}
{{/each}}
{{{product.idpText}}}
Magnification: 160 unit - 175,000 unit
Resolution: 0 nm - 15 nm
Desktop SEM that is economical and easy to use, with reliable automation features. The Thermo Scientific Phenom Pure Desktop Scanning Electron Microscope (SEM) is an ideal tool for the transition from ...
Magnification: 160 unit - 200,000 unit
Resolution: 0 nm - 10 nm
... cleanliness analysis with a multi-purpose desktop SEM. Desktop SEM for component cleanliness analysis The Thermo Scientific Phenom ParticleX TC Desktop SEM is a multi-purpose desktop SEM ...
Digital microscope for failure analysis, quality assurance and control, research and development or forensics. The outstanding optics, intuitive handling and intelligent software enables the user to get reliable results. ...
Magnification: 3,000,000 unit
Resolution: 0.8, 0.4, 1.2 nm
The Cold Field Emission source is ideal for high-resolution imaging with a small source size and energy spread. Innovative CFE Gun technology contributes the ultimate FE-SEM with superior beam brightness and stability, affording high-resolution ...
Hitachi High-Tech Europe GmbH
Resolution: 1.2 nm
... -based system for SEM imaging that goes beyond basic preset conditions and recipes. Its ease of use opens a new gateway for material research, development, and area beyond our imagination. The SU5000 FE-SEM has forever ...
Hitachi High-Tech Europe GmbH
Magnification: 5 unit - 800,000 unit
Resolution: 15, 4, 3 nm
Performance & Power in a Flexible Platform Hitachi High-Tech's scanning electron microscopes SU3800/SU3900 deliver both operability and expandability. The operator can automate many operations and efficiently utilize ...
Hitachi High-Tech Europe GmbH
Surface morphology is an important property for many high-tech surfaces with features as small as a few nanometers and surface roughness below one nanometer. The Nanite is the tool of choice for surface analysis of workpieces of all shapes ...
... environmental control, in-plane magnetic field control, and scripting. The CoreAFM is more than just an all-in-one atomic force microscope, it is a complete solution for your nanoscale research and analysis. Easy ...
The Nanosurf LensAFM is an atomic force microscope that picks up where optical microscopes and profilometers reach their resolution limits. It is mounted like a normal objective lens, thus extending the ...
Weight: 9.5 kg
Length: 657 mm
Width: 251 mm
... Modular Motorised and Manual Upright Microscopes Superb Nikon CFI60-2 optics provide excellent images to both eyepieces and to Nikon’s digital imaging cameras with analysis software. The universal microscope ...
Nikon Metrology
Magnification: 10 unit - 5,480,000 unit
Resolution: 0.7 nm - 3 nm
... dispersive X-ray spectrometer (EDS), as a common platform. The JSM-IT800 allows for the replacement of the objective lens of the SEM as a module, offering different versions to satisfy various users requirements. With ...
... documentation of the surface of a component to reveal irregularities. Scanning Electron Microscope | SEM | Microhone | CNC Tooling A Scanning Electron Microscope (SEM) is used to ...
... environmental influences. Typical measuring tasks • Roughness measurements as per • ISO 4287 & ISO 13565 / ISO 25178 • Topography measurements (including volume, wear, tribology) • contour and form (2D, 3D) • ...
MAHR
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