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Visible spectrophotometer Cary 6000i
UV-Vis-NIRNIRreflectance

Visible spectrophotometer - Cary 6000i - Agilent Technologies - Life Sciences and Chemical - UV-Vis-NIR / NIR / reflectance
Visible spectrophotometer - Cary 6000i - Agilent Technologies - Life Sciences and Chemical - UV-Vis-NIR / NIR / reflectance
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Characteristics

Spectrum
visible, UV-Vis-NIR, NIR
Measurement method
reflectance, transmission
Other characteristics
benchtop, large
Wavelength

Max.: 1,800 nm

Min.: 175 nm

Width

1,020 mm
(40.16 in)

Depth

710 mm
(28 in)

Height

380 mm
(15 in)

Weight

91 kg
(200.62 lb)

Description

The Cary 6000i UV-Vis-NIR spectrophotometer has been tailored for unmatched photometric performance in the short-wave infrared (SWIR) 800–1800 nm range as well as the UV-visible 175 to 800 nm. The superior sensitivity of the narrow-band InGaAs detector is optimally harnessed by preferencing the spectrophotometer’s optical throughput in the SWIR region. Its 600 lines-per-mm NIR diffraction grating, blazed at 1000 nm, concentrates optical dispersion into the 800–1800 nm region, eliminating wasted photons that would otherwise fall beyond the range of the detector. The Cary 6000i is your ultimate tool for materials characterization spectroscopy. Using Cary WinUV software with the Cary 6000i makes it easy to perform powerful analysis and control optional accessories. The large sample compartment can be expanded to hold large accessories and integrating spheres for spectral and diffuse reflectance. The LockDown mechanism makes it possible to quickly change and position accessories for reproducible results. Features Measure beyond 8.0 absorbance units with reference beam attenuation. Measure 175 to 1800 nm using a narrow-band InGaAs detector and 600 l/mm NIR diffraction gratings for unmatched sensitivity in the short-wave infrared. Cary WinUV software—modular software with powerful analysis and enhanced transfer and report export capabilities. Versatile set of accessories for materials characterization spectroscopy, including spectral and diffuse reflectance. Variable slit widths (down to 0.01 nm) for optimum control over data resolution. Large sample compartment with LockDown mechanism for quick accessory changes and reproducible results.

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