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  4. Agilent Technologies - Life Sciences and Chemical

UV-Vis-NIR spectrophotometer Cary 5000
reflectancebenchtop110 V

UV-Vis-NIR spectrophotometer - Cary 5000  - Agilent Technologies - Life Sciences and Chemical - reflectance / benchtop / 110 V
UV-Vis-NIR spectrophotometer - Cary 5000  - Agilent Technologies - Life Sciences and Chemical - reflectance / benchtop / 110 V
UV-Vis-NIR spectrophotometer - Cary 5000  - Agilent Technologies - Life Sciences and Chemical - reflectance / benchtop / 110 V - image - 2
UV-Vis-NIR spectrophotometer - Cary 5000  - Agilent Technologies - Life Sciences and Chemical - reflectance / benchtop / 110 V - image - 3
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Characteristics

Spectrum
UV-Vis-NIR
Measurement method
reflectance
Other characteristics
benchtop
Power supply
110 V
Wavelength

Min.: 175 nm

Max.: 3,300 nm

Width

1,020 mm
(40.16 in)

Depth

710 mm
(28 in)

Height

380 mm
(15 in)

Weight

91 kg
(200.62 lb)

Description

The Cary 5000 UV-Vis-NIR spectrophotometer is a high-performance UV-Vis and NIR spectrophotometer with superb photometric performance in the 175–3300 nm range. The latest generation of PbSmart detector has improved its sensitivity and lowered stray-light in the NIR, making it a powerful tool for materials science research. The Cary WinUV software, a modular Windows-based software, makes it easy to perform powerful analysis and control a number of optional accessories. The large sample compartment can be expanded to hold large accessories and integrating spheres for spectral and diffuse reflectance. The LockDown mechanism makes it possible to quickly change and position accessories for reproducible results. Features Measure beyond 8.0 absorbance units with reference beam attenuation. Measure 175 to 3300 nm using a PbSmart NIR detector for lower stray light and extended photometric range. Cary WinUV software—modular software with powerful analysis and enhanced transfer and report export capabilities. Versatile set of accessories for materials research, including spectral and diffuse reflectance. Variable slit widths (down to 0.01 nm) for optimum control over data resolution. Large sample compartment with LockDown mechanism for quick changes and positioning—for reproducible results. Maximum light throughput using Schwarzchild coupling optics for higher accuracy at low transmission levels. Minimal noise and stray light using a floating aluminum casting and double Littrow monochromator. Extended dynamic range by attenuating the reference beam to balance double beam signal levels.

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