• Sensor controlling/optimization.
• 10 bit DAC for adjustment of the excitation voltages.
• Driver for generation of the recharging voltages for
• continuous and self-test modes.
• Internal reference voltage via adjustable band gap
• Two charge amplifiers with programmable offset and
• integration capacitances
• Two sample-and-hold amplifiers for the analogue outputs
• Amplifier for analogue signal before the A/D converter
• 14 bit A/D converter of the analogue signals
• Digital sensor characteristic curves and temperature
• correction
• FIR filter block of four filters, with up to 31 selectable sampling points per filter
• Digital configuration of threshold detection
• Component for handling SIL-relevant measurements and test cases (self-test after Power-ON,
• continuous test of two counter phase sensor elements of the same axis)
• Analogue multiplexer for output of analogue voltage, test or reference voltage
• SPI and I2C Interface
• Real-time data transmission from ASIC, SPI master mode
• Power-On-Reset (POR) with configuration from EEPROM
• Internal clock generator
• Internal temperature sensor