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Scanning probe microscope OS-AAAFMSTMdigital
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Characteristics
- Type
- AFM, scanning probe, STM, digital
- Technical applications
- for research, multipurpose
- Configuration
- benchtop
- Resolution
0.1 nm, 0.13 nm, 0.26 nm
Description
The OS-AA SPM system is known for its multifunctionality and openness. It is a platform for experiments that are unconventional and further development than a mere detecting facility. It is not merely a detecting facility. It also includes functions like STM, AFM, LFM, MFM, EFM, and techniques such as contacting mode, tapping, and phase imaging. The SPM system has the imaging facility with full digital control 16bit ADC/DAC. The SPM system has high speed communication that has been based on TCP/IP protocol for double-CPU-double-OS and large data-exchange. It is possible to further extend the input/output signal channel. It has a standard external open interface for second developments. Its multimedia technology is capable of nano-manipulating. The system is designed for Windows Vista/XP/NT/2000/9X.
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See all of Angstrom Advanced‘s catalogsOther Angstrom Advanced products
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