Vector network analyzer ME7838x4 series
signalspectrumcompact

Vector network analyzer - ME7838x4 series - Anritsu - signal / spectrum / compact
Vector network analyzer - ME7838x4 series - Anritsu - signal / spectrum / compact
Vector network analyzer - ME7838x4 series - Anritsu - signal / spectrum / compact - image - 2
Vector network analyzer - ME7838x4 series - Anritsu - signal / spectrum / compact - image - 3
Vector network analyzer - ME7838x4 series - Anritsu - signal / spectrum / compact - image - 4
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Characteristics

Measured entity
signal
Application domain
vector network
Measured value
spectrum
Configuration
compact
Other characteristics
calibration, broadband

Description

The VectorStar ME7838x4 Broadband systems provide high performance 4-port measurements utilizing compact mmwave modules with industry-best calibration stability. While other broadband systems continue to provide raw performance with negative directivity in critical frequency bands, the ME7838 series, which includes the 4-port systems includes broadband systems with positive raw directivity. The result is better calibration stability and better measurement stability with significantly longer time between calibrations for accurate measurements and improved productivity. The new ME7838G4 takes high performance 4-port broadband measurements to a new level by incorporating the Anritsu MA25400A mmWave module. The MA25400A module combines Anritsu developed Nonlinear Transmission Line (NLTL) technology in a small, compact high performance mmWave module with a 0.6 mm test port connector for measurements up to 220 GHz. Spectrum Analyzer Option The spectrum analyzer option is the world’s first single sweep spectrum analyzer that covers frequency ranges from 70KHz to 220GHz using mm-wave modules. The Spectrum analyzer option is available on all baseband VectorStar models. The Spectrum Analyzer option (Option 49) allows for convenient spectral domain measurements of quantities such as harmonics, spurs, distortion products, and general frequency content of a variety of devices. Common measurements include harmonics, tone-based distortion measurements, some spurious measurements, and spectral occupancy tests on devices that may include multiple outputs or input-output comparisons. .

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Exhibitions

Meet this supplier at the following exhibition(s):

MWC 2025
MWC 2025

3-06 Mar 2025 Barcelona (Spain) Hall 5 - Stand 5D41

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