Optical microscope CW2010-DIC
measuringdifferential interference contrast

Optical microscope - CW2010-DIC - Beijing Cap High Technology Co.,Ltd. - measuring / differential interference contrast
Optical microscope - CW2010-DIC - Beijing Cap High Technology Co.,Ltd. - measuring / differential interference contrast
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Characteristics

Type
optical
Technical applications
measuring
Observation technique
differential interference contrast
Magnification

2 unit, 5 unit, 10 unit, 20 unit, 50 unit

Description

Characteristic: 1.Converter:Five-hole,Each hole adjusting the focus and dispatch center.Eliminate errors to ensure accuracy.(Exclusive patent) 2.Z-axis use the Split-image principle observed measurement,To combine precision Z-axis rail it can keep,Can effectively guarantee the accuracy of the measurement. 3.DIC prism can move horizontal and vertical, the relief image formed by the linearly polarized light of the two directions will produce a strong three-dimensional。This can not be achieved in a normal optical system. 4.Long Working Distance 5.Light source can choose LED or Fiber cold light source 6.All parts and the assembly of the optical system are imported components. By technical engineers abroad gatekeeper, commissioning and technical control package of DIC systemTechnical parameters Application: CW2010-DIC is Infinity optical system,Suitable for the quality testing of chip packaging, observation and measurement of the tiny protrusions and minor scratches. Widely used in electronics, materials, chemical and other fields of research and testing. Is the ideal instrument for research institution's and universities' research and teaching.

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