X-ray diffractometer D8 DISCOVER

XRDSAXSGISAXS

The most versatile and flexible XRD Solution to perfectly match the requirements of research, development and quality control in industry and academia. X-ray sources with outstanding brilliance, such as the IµS microfocus X-ray souce and the HB-TXS High-Brillliance Turbo X-ray Souce HB-TXS. The D8 DISCOVER is the flagship multi-purpose X-ray diffractometer offering leading technology components. It is designed for the structural characterization of the full range of materials from powders, amorphous and polycrystalline materials to epitaxial multi-layered thin films at ambient and non-ambient conditions. Applications: Phase Identification and quantification, structure determination and refinement, Micro strain and crystallite size analysis, X-Ray reflectometry, Grazing Incidence Diffraction (GID), In-Plane Diffraction, High-resolution XRD, GISAXS, GI-Stress analysis, crystal orientation analysis Residual Stress analysis, Texture and pole figures, micro X-ray Diffraction, Wide Angle X-ray Scattering (WAXS), Total scattering analysis: Bragg Diffraction, Pair-Distribution Function (PDF), Small Angle X-Ray Scattering (SAXS)