X-ray detector QUANTAX EDS

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Energy-Dispersive Spectrometry for SEM, FIB-SEM and EPMA Bruker's latest generation of QUANTAX EDS features the XFlash® 7 detector series, which provides the largest solid angle for X-ray collection (also called collection angle) and the highest throughput. The XFlash® 7 continues to set standards in performance and functionality in energy-dispersive spectrometry for the Scanning Electron Microscope (SEM), Focused Ion Beam (FIB-SEM) and Electron Probe Micro Analyzer (EPMA). The XFlash® 7 detector family also offers optimized solutions for EDS analysis of electron transparent specimens in TEM and SEM, as well as the unique XFlash® FlatQUAD, a detector made to answer your questions on challenging samples. Slim-line technology, large collection angle design, latest generation pulse processing, maximized system uptime through predictive maintenance. Highest spectral performance obtained with best energy resolution. Increased accuracy of results by sophisticated quantification algorithms and a unique combination of standardless and standard-based methods. Gain very precise results faster with individually optimized EDS systems. It ensures unmatched speed and precision. Shorten measurement time with maximized throughput, enabling mapping and quantification at all settings with no limitation of data size. Analyze challenging samples now, thanks to the most efficient geometric collection of generated X-rays. Benefit from accurate and reliable quantification results with optimized geometry minimizing background and avoiding absorption. Detect small quantities with better detection limit, lower background and less absorption.