Optical profilometer ContourX-500

3Dwhite light interferometryindustrial

Fully automated benchtop for 3D metrology Our Most Advanced Benchtop Design Advanced automation configured with encoded XY stage, auto tip/tilt head, and auto intensity Easy-to-use interface for quick, accurate results Wide range of customizable automation features for unique and specialized measurement and analysis The ContourX-500 Optical Profilometer is the world’s most comprehensive automated benchtop system for fast, non-contact 3D surface metrology. The gage-capable ContourX-500 boasts unmatched Z-axis resolution and accuracy, and provides all of the industry-recognized advantages of Bruker’s white light interferometry (WLI) floor-standing models in a much smaller footprint. The profiler is easily customized for the widest range of complex applications, from QA/QC metrology of precision machined surfaces and semiconductor processes to R&D characterization for ophthalmics and MEMS devices. Tip/tilt optical head Measures surface features over a range of angles while minimizing tracking errors. Most advanced user interface Provides intuitive access to an extensive library of pre-programmed filters and analyses. Integrated air isolation Provides best metrology precision in a space-efficient footprint.