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CAMECA
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Exhibitions
All CAMECA products
SIMS
mass spectrometer
IMS 7f-Auto
secondary ion mass
for the semiconductor industry
PMT
mass spectrometer
IMS 7f-GEO
secondary ion mass
process
compact
mass spectrometer
IMS 1300-HR³
secondary ion mass
for analysis
high-resolution
mass spectrometer
KLEORA
IMS
for analysis
mass spectrometer
NanoSIMS 50L
secondary ion mass
laboratory
PMT
mass spectrometer
IMS Wf & SC Ultra
IMS
process
for the semiconductor industry
quadrupole spectrometer
AKONIS
IMS
process
for the semiconductor industry
mass spectrometer
SIMS 4550
secondary ion mass
for the semiconductor industry
PMT
APT
scanning probe microscope
Invizo® 6000
for research
3D
laser
scanning probe microscope
LEAP® 6000 XR
for research
3D
spectral
scanning probe microscope
EIKOS-UV™
for research
3D
scanning probe microscope
LEAP 5000 series
for research
3D
EPMA
electron probe microanalyzer (EPMA)
SKAPHIA
Microscope
Spectrometer
Laboratory microscope
Laboratory spectrometer
Compact spectrometer
Process spectrometer
Mass spectrometer
Automated microscope
Analysis spectrometer
High-resolution spectrometer
High-sensitivity spectrometer
Research microscope
Automated spectrometer
3D microscope
Quadrupole spectrometer
Confocal microscope
PMT spectrometer
Near field probe microscope
Laser microscope
Electronic spectrometer
see more
Spectral microscope
Scanning probe microscope
Spectrometer for the semiconductor industry
Ion mobility spectrometer
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