Scanning probe microscope LEAP 5000 series

for research3D

3D Atom Probe Microscope with unmatched 3D sub-nanometer analytical performance The LEAP 5000 is CAMECA's cutting-edge atom probe microscope, offering superior detection efficiency across a wide variety of metals, semiconductors and insulators: more than 40% extra atoms detected per nm3 analyzed. The LEAP 5000 collects nanoscale information from a microscale dataset in just a few hours and delivers improved compositional accuracy, precision and detection limits, enhanced sample throughput together with increased yield and ultimate reproducibility. Optimized detection efficiency provides unparalleled sensitivity Large Field-of-View and detection uniformity - the ultimate 3D spatial resolution Excellent multi-hit detection capabilities for the most accurate compositional measurements Fast and variable repetition rate for ultra-high speed data acquisition Robust & ergonomic platform for increased ease-of-use and reduced time-to-knowledge Live-time monitoring to ensure the highest quality data in every measurement Advanced laser control algorithms provide measurably improved sample yields The LEAP 5000 Family The LEAP 5000 XS combines new flight path technology with enhanced detector performance to offer improved field of view whilst achieving unprecedented detection efficiency ~ 80%, the highest of any such analytical technique! In addition, the advanced laser pulse module capable of offering repetition rates of up to 2 MHz makes the LEAP 5000 XS the ultimate in efficiency and productivity.