Scanning probe microscope LEAP® 6000 XR

for research3Dspectral

The first 3D Atom Probe with combined voltage & laser pulsed operation The LEAP® 6000 XR inherits key features from previous APT generations, adding deep UV laser pulsing to the proven local electrode design to deliver higher yield and data quality. Through compatibility with the microtip array and a redesigned optical system, the LEAP® 6000 XR provides enhanced ease of use and the potential for fully automated operation. Microtip compatible and capable of utilizing advanced automation features, CAMECA’s LEAP® 6000 XR offers improved yield and higher sensitivity for your research applications. It introduces a new operational mode that applies both a laser pulse and a voltage pulse to the specimen at the same time. Since the majority of the spectral background is caused by out of time evaporation due to the standing voltage, this results in a significantly lower background throughout the experiment. Deep UV laser wavelength providing Improved yield and a more accurate reconstruction Synchronous voltage plus laser pulsing (VLP) operation which results in higher sensitivity and easier peak identification LEAP Automation which enables off-hours and unattended operation for a faster return on investment