Scanning probe microscope EIKOS-UV™

for research3D

The Atom Probe that enables routine, high performance 3D nano-analysis for both research and industry Building on 30 years of success in Atom Probe Tomography instrumentation and application, CAMECA has developed EIKOS-UV™, the Atom Probe microscope for rapid alloy development and nanoscale materials research. The EIKOS Atom Probe offers: Three-dimensional tomography with nanoscale characterization of microstructures High spatial resolution single atom detection with high efficiency Equal sensitivity to all elements and their isotopes Quantitative composition measurement (sub-nm to near micron scale) Available in voltage or voltage & laser configurations Standard specimen preparation methods EIKOS is available in 2 configurations: The base EIKOS system incorporates a reflectron design to provide excellent mass resolving power and signal to noise. A pre-aligned integrated counter electrode ensures ease of use and high reliability. The voltage pulsing system provides very high data quality on a wide variety of metallurgical applications. The fully configured EIKOS-UV system combines all the outstanding features of the base EIKOS (voltage pulsed, reflectron based functionality, prealigned counter electrode) and adds a fully integrated 355 nm laser pulsing module with computer controlled focused spot design to provide access to a larger application range. The base EIKOS system is field upgradable to the EIKOS-UV.