Current testing device TH2829AX-48
resistanceautomatictransformer

Current testing device - TH2829AX-48 - Changzhou Tonghui Electronic Co., Ltd. - resistance / automatic / transformer
Current testing device - TH2829AX-48 - Changzhou Tonghui Electronic Co., Ltd. - resistance / automatic / transformer
Current testing device - TH2829AX-48 - Changzhou Tonghui Electronic Co., Ltd. - resistance / automatic / transformer - image - 2
Current testing device - TH2829AX-48 - Changzhou Tonghui Electronic Co., Ltd. - resistance / automatic / transformer - image - 3
Current testing device - TH2829AX-48 - Changzhou Tonghui Electronic Co., Ltd. - resistance / automatic / transformer - image - 4
Current testing device - TH2829AX-48 - Changzhou Tonghui Electronic Co., Ltd. - resistance / automatic / transformer - image - 5
Current testing device - TH2829AX-48 - Changzhou Tonghui Electronic Co., Ltd. - resistance / automatic / transformer - image - 6
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Characteristics

Test type
current, resistance
Operating mode
automatic
Test material
transformer
Configuration
benchtop
Other characteristics
DC

Description

Automatic Transformer Test system Basic Accuracy: 0.05% Frequency: 20Hz-200kHz AC signal: 5mV-2V(Option 10V) DC Bias Current Source 0+/-10V, 0+/-100mA Max Test PINS: 48PIN LCR Function Optional Features ■ 7-inch TFT LCD display with a resolution of 800×RGB×480 ■ Frequency up to 1MHz, resolution: 0.5mHz ■ Signal level: 5mV-2Vrms, optional (2Vrms-10Vrms) ■ Built-in 0-100mA/0-10V bias power supply, optional 1A/2A bias current source ■ Up to 75 times / sec test speed ■ Diode forward and reverse characteristic detection ■ Improved high turns ratio and weakly coupled transformer test capability ■ Improved DCR testing capabilities ■ Single screen can accommodate all scan test results ■ Time stamping system: memory file setting, calibration deviation and deduction time ■ Sort the selected scanning parameters ■ Self-test scanning fixture relays ■ Flexible deviation deduction method ■ Multiple handling ways for FAIL cases ■ Single parameter test cycle to test independent windings ■ Increased security: administrator and operator passwords ■ Built-in statistical analysis capabilities: Cpk, Cp, Ck, etc. ■ Bar-code reading function can be used to select a setting file or to manage the type of test products ■ Optional PC-level instrument test setup file programming capability ■ Online upgrade mode: USBHOST or RS232 ■ Support multiple instrument networking through LAN interface ■ Backward compatible with TH2818X/TH2819X parameter setting file ■ Storage: Internal: 100 groups of settings file to save U disk: 500 groups of configuration files, CSV format test data, GIF format images

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