Light probe SuperView WX100

optical

SuperView WX100 White Light Interferometry Probe Functions Measurement function: it can realize high precision Z scanning of sample surface and obtain 3D image. Analysis function: It can obtain 2D and 3D data such as surface roughness, micro-nano-level contour size, etc. Programming function: Support pre-configured data processing and analysis tool steps, one-click to complete the whole process from measurement to analysis. Batch analysis: Data processing and analysis templates can be customized according to the customer demands, and one-click batch analysis can be realized for the same type of parameter data Semiconductor, polished silicon wafer, thin silicon wafer, wafer IC 3C electronics, sapphire glass roughness, metal shell mold defects, glass screen height difference