Light probe SuperView WX100
optical

Light probe - SuperView WX100  - Chotest Technology Inc. - optical
Light probe - SuperView WX100  - Chotest Technology Inc. - optical
Light probe - SuperView WX100  - Chotest Technology Inc. - optical - image - 2
Light probe - SuperView WX100  - Chotest Technology Inc. - optical - image - 3
Light probe - SuperView WX100  - Chotest Technology Inc. - optical - image - 4
Light probe - SuperView WX100  - Chotest Technology Inc. - optical - image - 5
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Characteristics

Measured value
light
Technology
optical

Description

SuperView WX100 White Light Interferometry Probe Functions Measurement function: it can realize high precision Z scanning of sample surface and obtain 3D image. Analysis function: It can obtain 2D and 3D data such as surface roughness, micro-nano-level contour size, etc. Programming function: Support pre-configured data processing and analysis tool steps, one-click to complete the whole process from measurement to analysis. Batch analysis: Data processing and analysis templates can be customized according to the customer demands, and one-click batch analysis can be realized for the same type of parameter data Semiconductor, polished silicon wafer, thin silicon wafer, wafer IC 3C electronics, sapphire glass roughness, metal shell mold defects, glass screen height difference

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Exhibitions

Meet this supplier at the following exhibition(s):

Laser World of Photonics China in Shanghai 2025

11-13 Mar 2025 Shanghai (China) Hall E7 - Stand 7336

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    26th Shenzhen International Industrial Exh.

    26-29 Mar 2025 Shenzheng (China) Hall 8 - Stand 8M52

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    *Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.