Optical profilometer SuperView W1-Ultra

3Dfor production linesindustrial

Model No.: SuperView W1-Ultra Product name: Nano 3D Optical Surface Profilometers Standard field of view: (0.98*0.98)mm Max field of view: (6x6)mm Reflectivity of test object: 0.5 % ~100 % Repeatability of Roughness RMS: 0.005nm Scanning range: ≤10mm Resolution: 0.1nm Accuracy of stage measurement: 0.3 % Repeatability of stage measurement: 0.08% 1σ SuperView W1-Ultra Optical 3D Surface profilometer is an ideal instrument for sub-Nanometer measurement of various precision parts. Based on the principle of white light interference technology, combined with precision Z-direction scanning module and 3D modeling algorithm, it contactlessly scans the surface of the object then establish a 3D image for the surface. A serial of 2D, 3D parameters reflecting surface quality of the object are obtained after XtremeVision software processes and analyzes the 3D image. The SuperView W1 is a user-friendly precision optical instrument with powerful analysis functions for all kinds of surface form & roughness parameters. With unique light source it could measure various precision parts with both smooth and rough surface.