- Metrology - Laboratory
- Metrology and Test Equipment
- Optical profilometer
- Chotest Technology Inc.
Optical surface measuring machine SuperView W1-Lite3Dindustriallaboratory
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Characteristics
- Technology
- optical, 3D
- Domain
- industrial, laboratory
- Configuration
- benchtop
- Other characteristics
- non-contact
Description
Model No.: SuperView W1-Lite
Product name: Nano 3D Optical Surface Profilometers
Standard field of view: (0.98*0.98)mm
Max field of view: (6x6)mm
Reflectivity of test object: 0.05 % ~100 %
Repeatability of Roughness RMS: 0.01nm
Scanning range: ≤10mm
Resolution: 0.1nm
Accuracy of stage measurement: 0.3 %
Repeatability of stage measurement: 0.08% 1σ
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Exhibitions
Meet this supplier at the following exhibition(s):
The 7th China (Shanghai) International Metrology Measurement Technology and Equipment Exhibjtion
17-19 May 2025 Shanghai (China) Stand 183-186
More information
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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.