Tungsten filament microscope SEM 3300

scanning electronfor analysisfor materials analysis

SEM3300 is a new generation of tungsten filament scanning electron microscope with a resolution better than 2.5 nm @ 20kV. The special electron optics design breaks through the resolution limit of tungsten filament , reaches a resolution of 5 nm at a low voltage of 1 kV. It has excellent imaging quality, can obtain high- resolution images in various field of view ranges, delivers large depth of field. Great expandability enables to explore the world of microscopic imaging. Features 1.Resolution：2.5 nm @ 20 kV, SE；4 nm @ 3 kV, SE；5 nm @ 1 kV, SE 2.Magnification：1 ~ 300,000 x 3.Acceleration Voltage：0.1 kV~ 30 kV 4.“SuperTunnel”：Electron Optics Technology 5.Low Voltage High Resolution lmaging：Achieved by Electron Optics Column Beam Deceleration Technology 6.Electromagnetic& Electrostatic Combo Objective Lens：Effectively reduces lens aberration, improves image resolution at low voltages, compatible to imaging of magnetic samples 7.In-column Electron Detection Technology：Improves signal electron capturing efficiency, realizes high signal-to-noise ratio at high resolution 8.Optical Navigation:Quickly locates targeted samplecoordinates and Regions of Interest(ROI) 9.*AutoMap:Fully automated image acquisition & stitching, mapping a large Field of View