Field emission scanning electron microscope SEM4000X

inspectionlaboratoryfor materials analysis

The SEM4000X is a stable, versatile, flexible, and efficient field emission scanning electron microscope (FE-SEM). It achieves a resolution of 1.9nm@1.0kV, easily tackles high-resolution imaging challenges for various types of samples. It can be upgraded with an ultra-beam deceleration mode to enhance low-voltage resolution even further. The microscope utilizes multi-detector technology, with an in-column electron detector (UD) capable of detecting SE and BSE signals while providing high-resolution performance. The chamber-mounted electron detector (LD) incorporates crystal scintillator and photomultiplier tubes, offering higher sensitivity and efficiency, resulting in stereoscopic images with excellent quality. The graphic user interface is user-friendly, featuring automation functions such as automatic brightness & contrast, auto-focus, auto stigmator, and automatic alignment, allowing for rapid capture of ultra-high-resolution images.