This product is a capacitance mater card compliant with PCI Express bus and equipped with functions for measuring the electrostatic capacity (C) and coefficient of loss (D) of high-capacity ceramic capacitors at high speed and with high accuracy.
It is equipped with two channels of ports that can perform four-terminal measurement of capacitor capacity, and each channel can be set with a separate range and perform measurement separately. Windows device driver is supported with this product.
High-capacity ceramic capacitor measurement
This product can measure the electrostatic capacity (C) and coefficient of loss (D) of 400pF to 1.4mF ceramic capacitors.
Measurement frequencies of 1kHz and 120Hz and measurement voltages of 1.0Vrms and 0.5Vrms are available.
Equipped with two channels of four-terminal measurement ports
This product is equipped with two channels of ports that can perform four-terminal measurement of capacitor capacity, and each channel can be set with a separate range and perform measurement separately.
Capable of high-speed measurement, and capacity of measurement at constant voltage
The electrostatic capacity (C) and coefficient of loss (D) can be measured in 2msec at a frequency of 1kHz and in 10msec at a frequency of 120Hz. And automatically adjusts the output voltage so the voltage applied to the measurement target (capacitor) becomes the set voltage. Consequently, it is possible to measure the capacity of the capacitor with a constant measurement voltage at all times without being affected by voltage drops caused by, for example, the cable.