- Metrology - Laboratory
- Analytical Instrumentation
- Spectroscopy system
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Spectroscopy system CIP-FICO-II
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Description
► Independent fiber-coupled Tx and Rx heads
► Real-time spectroscopy
► Broadband sensitivity up to 4.0 THz
► Transmission and reflection modes
► Multiple lens options to accommodate a variety of imaging conditions
► Measurement point indicated by laser guide for precise alignment
Capabilities
► Stand-off reflection measurements
► Excellent for spectroscopic and imaging applications, including non-destructive testing
► Penetrates many dielectric materials
► Thickness and coatings measurements
► Optional XY imaging stage for fast and convenient imaging measurements
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THz
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