Thickness measuring system Essair™ Duplex

automaticfoilfor sheet materials

Essair™ Duplex ESSAIR™ DUPLEX is a measurement technology, patented by Electronic Systems, ideal for direct thickness measurement without contact. MAIN FEATURES It does not make use of any type of radioactive sources. Direct thickness measurement expressed in micron or mm. No contact with the material. Automatic calibration system. Category: Sensors. Tags: Composites, PVC calendering, Rubber, Sheets & foils. Description ESSAIR™ DUPLEX is installed on standard scanners for measurement in transmission mode, and is particularly suitable for rigid materials or for materials with a very high winding tension measurement. The sensor can be personalised depending on specific needs required by the application: • Edges detector • Security system to detect lumps and/or extra thickness (lump-detector), external to the measurement system ESSAIR™ DUPLEX sensor is assembled on board of the following screening devices with its own reference roll between the ones included in the range of Electronic Systems products: • SLIM DUPLEX