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Thickness measuring system Digilayer RFX
infraredfor film

Thickness measuring system - Digilayer RFX - Electronic SYSTEMS - infrared / for film
Thickness measuring system - Digilayer RFX - Electronic SYSTEMS - infrared / for film
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Characteristics

Measured physical value
thickness
Technology
infrared
Measured material
for film

Description

I.R. / Digilayer RFX The IR measurement sensor of the DIGILAYER series measure on line and without contact the thickness of the barrier layers present inside multi-layer films. MAIN FEATURES Ideal for the measurement of clear stretch film. Designed for installation in industrial environments also characterized by the presence of dust, fumes, etc. Category: Sensors. Tag: Cast film. Description Infrared radiations are the measurement method employed to determine the thickness of the materials like PP, PE, LDPE, etc. The module of measurement, composed by an emitter and a receiver, is installed on a standard I-bean scanner. The sensor management and the profiles display on the operator console of the measurement system is completely integrated with that of the total measurement. The sensor can be personalised depending on specific needs required by the application: Edges detector of the film Automatic correction of the profile of total thickness
*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.