Lately, the demand for highly accelerated stress test has been increasing due to density growth of electric and electronic parts.
The Highly Accelerated Stress Test Chamber has been primarily developed to conduct bias testing which applies constant voltage and signals. The standard equipment features two control modes: [unsaturated control] and [wet saturated control], while the M-type chamber additionally offers a [wet and dry bulb temperature control] mode.
The M-type chamber conforms to the IEC60068-2-66 standard.
A double stack model allows conducting 2 different tests at the same time, achieving space optimization and time saving.