Optical microscope MX63 series
laboratoryinspectionfor in-line wafer inspection

optical microscope
optical microscope
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Characteristics

Type
optical
Technical applications
laboratory, inspection, for in-line wafer inspection
Observation technique
fluorescence, dark field
Other characteristics
modular, ergonomic, for semiconductors, for big samples, for wafers
Resolution

1 µm

Description

The MX63 and MX63L microscope systems are optimized for high-quality inspections of wafers as large as 300 mm, flat panel displays, circuit boards, and other large samples. Their modular design enables you to choose the components you need to tailor the system to your application. These ergonomic and user-friendly microscopes help increase throughput while keeping inspectors comfortable while they do their work. Combined with OLYMPUS Stream image analysis software, your entire workflow, from observation to report creation, can be simplified.

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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.