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Stationary thickness gauge 3 nm - 100 µm | F30 series
spectral reflectancebenchtop

Stationary thickness gauge - 3 nm - 100 µm | F30 series - Filmetrics Inc. - spectral reflectance / benchtop
Stationary thickness gauge - 3 nm - 100 µm | F30 series - Filmetrics Inc. - spectral reflectance / benchtop
Stationary thickness gauge - 3 nm - 100 µm | F30 series - Filmetrics Inc. - spectral reflectance / benchtop - image - 2
Stationary thickness gauge - 3 nm - 100 µm | F30 series - Filmetrics Inc. - spectral reflectance / benchtop - image - 3
Stationary thickness gauge - 3 nm - 100 µm | F30 series - Filmetrics Inc. - spectral reflectance / benchtop - image - 4
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Characteristics

Type
stationary
Technology
spectral reflectance
Other characteristics
benchtop

Description

Measure deposition rates, film thickness, optical constants (n and k), and uniformity of semiconductors and dielectric layers in real-time with the F30 spectral reflectance system. Example Layers MBE and MOCVD: Smooth and translucent, or lightly absorbing films, may be measured. This includes virtually any semiconducting material, from AIGaN to GaInAsP.
*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.