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Probe Systems
wafer microscope
MPS150
optical
for surface inspection
binocular
indicative price *
$13,900
wafer microscope
Genius
optical
educational
measuring
fully-automatic measurement system
SUMMIT200
for wafers
for semiconductors
for calibration
temperature measurement system
Summit
for wafers
for calibration
high-precision
temperature measurement system
IMS-K-mmW/THz
for wafers
for calibration
rugged
temperature measurement system
IMS-K-SiPh
optical
for wafers
for semiconductors
temperature measurement system
IMS-K-Power
for wafers
for semiconductors
rugged
temperature measurement system
IMS-K-DC
for wafers
temperature measurement system
IMS-K-LFN
for wafers
wafer measurement system
PA200 BlueRay
high-speed
wafer measurement system
PM8
microscope
wafer measurement system
EPS200RF
for calibration
microscope
wafer measurement system
EPS200MMW
microscope
wafer measurement system
CM300xi-ULN
temperature measurement system
CM300xi
for wafers
for calibration
microscope
optical measurement system
CM300xi-SiPh
fully-automatic
for wafers
for calibration
3D measurement system
PM300
for wafers
for semiconductors
microscope
temperature measurement system
Autonomous DC
automatic
for wafers
temperature measurement system
Autonomous RF
for wafers
for calibration
microscope
wafer measurement system
SiPh
microscope
wafer measurement system
TESLA300
for semiconductors
microscope
Probes
resistance probe
InfinityXT
microwave
resistance
resistance probe
Infinity
measurement
broadband
resistance probe
Infinity Waveguide
resistance probe
|Z| Probe® Power
reflection
microwave probe
ACP
rugged
resistance probe
T-Wave
substrate
Multiline TRL Cal
resistance probe
InfinityQuad
probe
DC-Q
Probe Cards
probe card
HFTAP Series
probe card
PH Series
probe card
SmartMatrix
Metrology
fully-automatic measurement system
MicroProf® AP
for wafers
camera inspection system
MicroProf® DI
optical
2D
infrared
3D measurement system
MicroProf® FE
for wafers
wafer measurement system
MicroProf® FS
thickness measurement system
MicroProf® MHU
flatness
roughness
robotic
thickness measurement system
MicroProf® 100
optical
for wafers
compact
roughness measurement system
MicroProf® 200
non-destructive
high-resolution
shape measurement system
MicroProf® 300
roughness
non-destructive
Quantum Cryogenics
cryogenic probe station
IQ3000
cryogenic probe station
Kilimanjaro 122
cryogenic probe station
Kilimanjaro 125
cryogenic probe station
Kilimanjaro 1260
laser scanning system
IQ1000
automated
vacuum cryostat
Denali 102
compact cryostat
Rainier 103
cryostat
Olympus 104
cryostat
Shasta 106
Measuring system
Microscope
Optical microscope
Inspection system
Optical measuring system
Automatic measuring system
Inspection microscope
Benchtop microscope
Laser scanner
High-precision measuring system
Measuring microscope
Camera inspection system
Educational microscope
Binocular microscope
Compact measuring system
3D measuring system
Thickness measuring system
Calibration measuring system
Measurement inspection system
High-speed measuring system
see more
Shape measuring system
Rugged measuring system
High-resolution measuring system
Optical inspection system
Temperature measuring system
Scanning system
Ergonomic microscope
Wafer measuring system
Rugged probe
Modular microscope
Roughness measuring system
Fully-automatic measuring system
Automated scanner
Flatness measuring system
2D inspection system
Broadband probe
Non-destructive measuring system
Semiconductor measuring system
Cryostat
Resistance probe
Probe station
Substrate
Robotic measuring system
Microscope measuring system
Thickness inspection system
Surface inspection microscope
Reflection probe
Resistance probe
Infrared inspection system
Automated scanning system
Wafer inspection system
Compact cryostat
Microwave probe
Probe card
Wafer microscope
Cryogenic probe station
Vacuum cryostat
Microscope with micromanipulator
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