Fully-automatic measurement system SUMMIT200

for wafersfor semiconductorscalibration

The new Cascade SUMMIT200 advanced 200mm probe system, is essential for collecting high accuracy measurement data on single or volume wafers; as fast as possible. Designed for R&D, device characterization/modelling or niche production applications, the SUMMIT200 probe station enables precision electrical measurements over temperature for ultra-low noise, DC, RF, mmW and THz applications, with semi-automatic and now fully-automatic operation, for fastest time to accurate data. The next generation probe system supports PureLine™ technology to achieve one of the lowest noise levels available on the market. Patented AttoGuard® and MicroChamber® technologies significantly improve low-leakage and low-capacitance measurements. A new advanced 200 mm fast stage, cassette handling up to 50 wafers, high throughput test features, and wide temperature range of -60°C to 300°C, provides everything needed for the scientist, R&D and test engineer, or production operator to get their job done fast. The SUMMIT200 probe station supports Contact Intelligence™ – a unique technology which enables autonomous semiconductor test. A powerful combination of innovative system design and state of the art image processing provides an operator-independent solution to achieve highly-reliable measurement data at any time and temperature. With a wide range of applications, and upgrade paths to meet any future needs, the SUMMIT200 provides the most advanced 200 mm probe station platform for fast, high accuracy and high-volume measurements for existing and future devices and ICs.