Temperature measurement system IMS-K-mmW/THz

for waferscalibrationrugged

Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight PNA for On-wafer R&D Measurements from RF to millimeter wave to Terahertz FormFactor and partner Keysight applications experts will help you configure a robust, complete solution, including: • FormFactor probe system: CM300xi, SUMMIT200, EPS150RF, EPS150MMW (others available) • Manual, semi-automatic and fully automatic probes station options • FormFactor analytical probes: Infinity, InfinityXT, T-Wave (others available) on manual or motorized positioners • FormFactor calibration accessories: WinCal XE, Impedance Standard Substrate for LRRM, Multiline TRL Cal Substrate calibrations (others avail.) • FormFactor RF automation software: Autonomous RF Measurement Assistant for improved uncertainty and throughput optional) • Full over temperature measurements and automation from -60°C to +200°C • Keysight vector network analyzer and frequency extenders up to 130GHz : N5290A/91A PNA MM-Wave, N524xB PNA-X, N522xB PNA (others available) • Keysight automation and modeling software: WaferPro XP, PathWave, IC-CAP • Virginia Diodes (VDI) Mini frequency extenders for measurement from 75GHz to 1.1THz (optional) • Easy swap RF application arms for mounting RF coax, mm-wave coax, waveguide extenders and load-pull tuners • To complete the system: cables, adapters, mounting hardware, etc.