Temperature measurement system IMS-K-SiPh
opticalfor wafersfor semiconductors

temperature measurement system
temperature measurement system
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Characteristics

Measured physical value
temperature
Technology
optical
Measured material
for wafers, for semiconductors
Applications
calibration
Other characteristics
rugged

Description

Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight Photonics Application Suite Hardware and Software FormFactor and partner Keysight applications experts will help you configure a robust, complete solution, including: • FormFactor probe system: CM300xi, SUMMIT200, MPS150 (others available) • Manual, semi-automatic and fully automatic probes station options • FormFactor analytical probes: RF and DC probes on manual or motorized positioners • FormFactor Integrated Single, Dual or 3 sided HexNano Optical Positioning • FormFactor photonics automation software: SiPh-Tools and Photonics Controller Interface for automated optical positioner calibrations and control • Temperature measurements and automation from -40°C to +125°C • Tunable lasers, power meters, and polarization synthesizer: Keysight N7776C, N7778C, N7744C, N7745C, N7786C, N7788C (others available) • Modular lasers: Keysight 81606A, 81607A, 81608A and 81602A (others available) • Keysight semiconductor parameter analyzer or PXIe SMUs for Optical to Electrical (O-E): B2901A, B1500A, M9601A PXI SMU (others available) • Keysight test and automation oftware: Photonics Application Suite (PAS), PathWave Test Automation with FormFactor Wafer prober plug-in • To complete the system: cables, adapters, mounting hardware, etc.

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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.