Temperature measurement system IMS-K-Power

for wafersfor semiconductorsrugged

Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight PDA for On-wafer R&D Power Semiconductor Device Characterization Measurements FormFactor and partner Keysight applications experts will help you configure a robust, complete solution, including: • FormFactor probe system: TESLA300, TESLA200, T200, EPS150TESLA (others available) • Manual, semi-automatic and fully automatic probes station options • FormFactor analytical probes: High Voltage Probes, High Current Probes, High-Power Probes • T.I.P.S. “LuPo” High Voltage / High Power Probe Card (optional) • Full over temperature measurements and automation from -60°C to +300°C • Keysight power device analyzer (PDA): B1505A (others available) • Keysight automation and modeling software: EasyEXPERT group+ • To complete the system: cables, adapters, mounting hardware, etc. Industry’s Most Productive and Accurate Power Semiconductor Device Characterization System When testing Si and advanced GaN / SiC devices on-wafer instead of in-package, R&D engineers and test operators are faced with some major challenges to collect high accuracy data. These include the need for probe and system anti-arcing at high voltage, low resistance probe and wafer contacts for high current, and special handling for thinned wafers.