Temperature measurement system IMS-K-LFN

for wafers

Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight A-LFNA for On-wafer R&D Advanced Low-Frequency Noise Measurements FormFactor and partner Keysight applications experts will help you configure a robust, complete solution, including: • FormFactor probe system: CM300xi-ULN, SUMMIT200 (others available) • Manual, semi-automatic and fully automatic probes station options • FormFactor analytical probes: DCP probes (others available) on manual or motorized positioners • FormFactor DC automation software: Autonomous DC Measurement Assistant for unattended probing over temperature on small pads • Full over temperature measurements and automation from -60°C to +300°C • Keysight advanced low-frequency noise analyzer (A-LFNA): E4727B • Keysight automation and modeling software: PathWave WaferPro (WaferPro Express) • To complete the system: cables, adapters, mounting hardware, etc. Industry’s Most Productive and Accurate Advanced Low-Frequency Noise Measurement System On-wafer 1/f noise measurements are a critical component of any characterization and modeling test system. Due to the required sensitivity, such testing can be easily corrupted by interference from outside or inside the test system.