Wafer measurement system PA200 BlueRay

high-speed

The PA200 BlueRay™ enables high-throughput functional testing of optoelectronic (e.g. LED), MEMS (e.g. pressure sensors) and RF (e.g. SAW/BAW filters) devices. Its precision ensures smooth probe landing with safe, repeatable electrical contact. The PA200 BlueRay is designed for 24/7 operation and can be easily upgraded in the field with a wafer-handling robot. The PA200 BlueRay™ sets a new standard for high-speed accuracy. Its precision ensures smooth probe landing with safe, repeatable electrical contact. In combination with the unique Z-profiling function, even extreme variation in height, such as the case with warped wafers, can be compensated. This test approach reduces pad damage and easily allows devices to be bonded after testing, even with the thinnest of pads.FormFactor recognizes that flexibility and modularity are the keys to addressing your production testing needs and we have created a solution that scales with your requirements. As the throughput demands increase, an optional waferhandling robot specifically designed for the PA200 BlueRay can be docked onto the prober. This upgrade to a fullyautomated system is done in the field.