Wafer measurement system EPS200RF

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[prisna-wp-translate-show-hide behavior=”hide[/prisna-wp-translate-show-hide]A complete RF measurement package The application-focused EPS200RF is a complete solution for best-in-class RF measurements up to 67 GHz. Based on the PM8 system platform, the EPS200RF package includes all the hardware, software and accessories you need to confidently probe RF devices with pads as small as 25 µm x 35 µm. The EPS200RF is a dedicated advanced probing solution that comes with everything you need to achieve accurate measurement results in the shortest time, with maximum confidence. The system incorporates best-known methods for RF probing up to 67 GHz, with the ability to probe pads as small as 25 μm x 35 μm and beyond.A very rigid and stable system design of the EPS200RF, with cast frame and single platen with four-point support, allows you to achieve high accuracy. An integrated vibration-isolation solution protects contact quality over measurement time. Optimized optics, backlash-free X-Y-Z movement of RF positioners, and a contact separation drive with outstanding 1 μm repeatability, enable precise probe placement and contact repeatability comparable to semiautomated systems. Industry-benchmark cables support the highest magnitude and phase stability of measurements. Choose a pair of 40, 50, or 67 GHz RF probes from our Infinity Probe®, |Z| Probe®, ACP and FPC probe families for the best contact performance. With WinCal XE™ software, you receive patented LRRM and LRM+ methods for the best calibration accuracy